1.1 本指南涵盖了过度测试的使用，以减少必须测试以满足给定质量验收标准的零件数量。过度测试是在高于其规格应力的应力水平下测试样品数量的零件，以减少必要的数据量。本指南讨论了何时以及如何应用过度测试来形成承受辐射应力的电子零件存活率的概率估计。关于控制零件失效应力的概率分布的一些知识是必要的，尽管确切的知识可能会被对该分布的过度保守估计所取代。 1.2 本国际标准是根据世界贸易组织发布的关于制定国际标准、指南和建议的原则的决定中确立的国际公认的标准化原则制定的）委员会。 ======意义和用途====== 5.1 应在以下情况下进行过度测试（ 1 ）由于时间和成本的考虑，或者因为不能以足够的精度估计应力到失效的概率分布，通过变量进行测试是不切实际的，并且（ 2 )为了获得必要的置信度和生存概率，必须在规格应力下对数量不切实际的零件进行测试。

1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution. 1.2 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee. ====== Significance And Use ====== 5.1 Overtesting should be done when ( 1 ) testing by variables is impractical because of time and cost considerations or because the probability distribution of stress to failure cannot be estimated with sufficient accuracy, and ( 2 ) an unrealistically large number of parts would have to be tested at the specification stress for the necessary confidence and survival probability.