BS EN IEC 60749-26:2018确立了测试、评估和分类程序 根据组件和微电路对损坏或损坏的敏感性（敏感度） 暴露于特定人体模型（HBM）静电放电（ESD）导致的降解。本文件的目的是建立一种能够复制HBM故障和故障的测试方法 提供可靠、可重复的HBM ESD测试结果，测试人员之间不考虑 组件类型。可重复的数据将允许对HBM进行准确的分类和比较 ESD敏感性水平。半导体器件的ESD测试从该测试方法中选择，即机器模型 （MM）试验方法（见IEC 60749-27）或IEC 60749系列中的其他ESD试验方法。 除非另有规定，否则本试验方法为所选方法。交叉引用:EN 60749-27IEC 60749EN 60749IEC 60749-27ANSI/ESDA/JEDEC JS-001:2014购买本文件时可获得的所有现行修订均包含在购买本文件中。

BS EN IEC 60749-26:2018 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).The purpose of this document is to establish a test method that will replicate HBM failures and provide reliable, repeatable HBM ESD test results from tester to tester, regardless of component type. Repeatable data will allow accurate classifications and comparisons of HBM ESD sensitivity levels.ESD testing of semiconductor devices is selected from this test method, the machine model (MM) test method (see IEC 60749-27) or other ESD test methods in the IEC 60749 series. Unless otherwise specified, this test method is the one selected.Cross References:EN 60749-27IEC 60749EN 60749IEC 60749-27ANSI/ESDA/JEDEC JS-001:2014All current amendments available at time of purchase are included with the purchase of this document.