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现行 IEC 60749-20-1:2019 RLV
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Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat 半导体器件.机械和气候试验方法.第20-1部分:对湿气和焊接热的综合影响敏感的表面安装器件的搬运 包装 标签和装运
发布日期: 2019-06-26
IEC 60749-20-1:20 19 RLV包含官方IEC国际标准及其红线版本。Redline版本不是官方文档,它只有英文版本,为您提供了一种快速简单的方法来比较IEC官方标准与其以前版本之间的所有变化。 IEC 60749-20-1:20 19适用于所有在PCB组装过程中经历大量焊料回流工艺的器件,包括塑料封装封装、工艺敏感器件和其他由透湿材料(环氧树脂、有机硅等)制成的湿气敏感器件。)暴露在环境空气中。 本文件的目的是为SMD制造商和用户提供处理、包装、运输和使用已分类到IEC 60749中定义的级别的湿气/回流敏感SMD的标准化方法-20.提供这些方法是为了避免由于吸湿和暴露于可导致成品率和可靠性降低的焊料回流温度而造成的损坏。通过使用这些程序,可以通过干包装过程实现安全和无损坏的回流,从密封日期起在密封的干袋中提供最小的保质期能力。与上一版相比,此版本包括以下重大技术变更: -更新子条款,使试验方法更好地与IPC/JEDEC J-STD-033C保持一致,包括关于水性清洗和干包装注意事项的新章节; -增加了关于HIC(湿度指示卡)比色测试和烘烤表推导的两个附件。
IEC 60749-20-1:2019 RLV contains both the official IEC International Standard and its Redline version. The Redline version is not an official document, it is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 60749-20-1:2019 applies to all devices subjected to bulk solder reflow processes during PCB assembly, including plastic encapsulated packages, process sensitive devices, and other moisture-sensitive devices made with moisture-permeable materials (epoxies, silicones, etc.) that are exposed to the ambient air.
The purpose of this document is to provide SMD manufacturers and users with standardized methods for handling, packing, shipping, and use of moisture/reflow sensitive SMDs that have been classified to the levels defined in IEC 60749-20. These methods are provided to avoid damage from moisture absorption and exposure to solder reflow temperatures that can result in yield and reliability degradation. By using these procedures, safe and damage-free reflow can be achieved, with the dry packing process, providing a minimum shelf life capability in sealed dry-bags from the seal date. This edition includes the following significant technical changes with respect to the previous edition:
- updates to subclauses to better align the test method with IPC/JEDEC J-STD-033C, including new sections on aqueous cleaning and dry pack precautions;
- addition of two annexes on colorimetric testing of HIC (humidity indicator card) and derivation of bake tables.
分类信息
关联关系
研制信息
归口单位: TC 47
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