建立了一个标准程序，用于根据半导体器件暴露在规定的机器型号（MM）静电放电（ESD）下的损坏或退化敏感性对其进行测试和分类。可作为人体模型ESD试验方法的替代试验方法。目的是提供可靠、可重复的ESD测试结果，以便进行准确的分类。本试验方法适用于所有半导体器件，属于破坏性试验

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive