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BS IEC 62951-6:2019
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Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for sheet resistance of flexible conducting films
半导体器件 柔性可伸缩半导体器件
IEC 62951的本部分规定了弯曲和折叠试验下柔性导电膜的薄层电阻的术语、试验方法和报告。测量方法包括两点探针法、四点探针法和蒙哥马利法,可用于原位和非原位测量以及各向异性薄层电阻的测量。交叉引用:ISO 291:2008IEC 62951-1:2017购买本文件时提供的所有现行修订版均包含在购买本文件中。
This part of IEC 62951 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.Cross References:ISO 291:2008IEC 62951-1:2017All current amendments available at time of purchase are included with the purchase of this document.