IEC 62951-9:2022-半导体器件.柔性和可拉伸半导体器件.第9部分:单晶体管和单电阻器（1T1R）电阻存储单元的性能测试方法-国家标准馆·国家数字标准馆

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Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells 半导体器件.柔性和可拉伸半导体器件.第9部分:单晶体管和单电阻器（1T1R）电阻存储单元的性能测试方法

发布日期： 2022-12-14

                IEC 62951-9:2022（E）规定了评估单极型单晶体管单电阻器（1T1R）电阻存储单元性能的测试方法。本文件中的性能测试方法包括读取、成型、设置、重置、耐久性和保持性。本文件适用于柔性器件以及刚性电阻存储器器件，不受器件技术和尺寸的任何限制。

IEC 62951-9:2022(E) specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this document include read, forming, SET, RESET, endurance and retention. This document is applicable to flexible devices as well as rigid resistive memory devices without any limitations prone to device technology and size.

分类信息

发布单位或类别：国际组织-国际电工委员会

ICS分类： 31.080.99半导体分立器件 - 其他半导体分立器件

关联关系

研制信息

归口单位： TC 47

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