现行

DLS-MIL-STD-750F-2012

Test Methods For Semiconductor Devices
Test Methods For Semiconductor Devices

2012-01-03

现行

BS IEC 62951-4-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
半导体器件 柔性可伸缩半导体器件

2019-03-05

现行

IEC 62951-8-2023

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
半导体器件.柔性和可拉伸半导体器件.第8部分:柔性电阻存储器的可拉伸性、柔性和稳定性的试验方法

2023-01-19

现行

BS IEC 62951-5-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for thermal characteristics of flexible materials
半导体器件 柔性可伸缩半导体器件

2019-03-05

现行

IEC 62951-4-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
半导体器件.柔性和可伸展半导体器件.第4部分:柔性半导体器件衬底上柔性导电薄膜的疲劳评价

2019-02-27

现行

BS IEC 62951-6-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for sheet resistance of flexible conducting films
半导体器件 柔性可伸缩半导体器件

2019-05-15

现行

IEC 62951-5-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
半导体器件.柔性和可伸展半导体器件.第5部分:柔性材料热特性的试验方法

2019-02-27

现行

BS IEC 62951-7-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
半导体器件 柔性可伸缩半导体器件

2019-03-06

现行

IEC 62951-6-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
半导体器件.柔性和可拉伸的半导体器件.第6部分:柔性导电薄膜片电阻的试验方法

2019-05-06

现行

BS IEC 62951-2-2019

Semiconductor devices. Flexible and stretchable semiconductor devices-Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
半导体器件 柔性可伸缩半导体器件

2019-04-30

现行

IEC 62951-1-2017

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
半导体器件 - 柔性和可拉伸半导体器件 - 第1部分:柔性基板上导电薄膜的弯曲试验方法

2017-04-10

现行

KS C IEC 62951-1

반도체소자 — 유연성 및 신축성 반도체소자 — 제1부: 유연성 기판의 전도성 박막에 대한 굽힘 시험방법
半导体器件.柔性和可拉伸半导体器件.第1部分:柔性衬底上导电薄膜的弯曲试验方法

2022-11-22

现行

KS C IEC 62951-1

반도체소자 — 유연성 및 신축성 반도체소자 — 제1부: 유연성 기판의 전도성 박막에 대한 굽힘 시험방법
半导体器件.柔性和可拉伸半导体器件.第1部分:柔性衬底上导电薄膜的弯曲试验方法

2022-11-22

现行

IEC 62951-7-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
半导体器件.柔性和可拉伸半导体器件.第7部分:表征柔性有机半导体薄膜封装阻挡性能的试验方法

2019-02-27

现行

IEC 62951-2-2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
半导体器件.柔性和可伸展半导体器件.第2部分:柔性器件的电子迁移率、亚阈值摆幅和阈值电压的评估方法

2019-04-17

现行

BS IEC 62830-8-2021

Semiconductor devices. Semiconductor devices for energy harvesting and generation-Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
半导体器件 用于能量收集和发电的半导体器件

2021-11-04

现行

IEC 62951-9-2022

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
半导体器件.柔性和可拉伸半导体器件.第9部分:单晶体管和单电阻器（1T1R）电阻存储单元的性能测试方法

2022-12-14

现行

IEC 62830-8-2021

Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8: Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
半导体器件.能量收集和发电用半导体器件.第8部分:低功率电子设备用柔性和可拉伸超级电容器的试验和评估方法

2021-10-22

现行

BS IEC 60747-5-4-2022

Semiconductor devices-Optoelectronic devices. Semiconductor lasers
半导体器件.光电器件 半导体雷射

2022-06-20

现行

BS IEC 60747-14-4-2011

Semiconductor devices. Discrete devices-Semiconductor accelerometers
半导体器件 分立器件

2011-02-28